The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 1979

Filed:

Aug. 25, 1977
Applicant:
Inventors:

Jun Ikebe, Tokyo, JP;

Yoriaki Kumagai, Tokyo, JP;

Kintomo Takakura, Tokyo, JP;

Michio Ohta, Yokohama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
128 / ; 73731 ;
Abstract

System for measuring or monitoring the intracranial pressure which comprises a non-elastic detecting pouch to be inserted into the space between the skull and the cerebrum, a flexible tube connected to the pouch, a device for supplying a liquid into the pouch through the flexible tube and a device for measuring the pressure of the liquid in the pouch. When the pressure of the liquid reaches the intracranial pressure, the curve showing relation between liquid pressure vs. pouch volume flattens. Thus, by measuring the pressure of the flattened region, intracranial pressure may be determined.


Find Patent Forward Citations

Loading…