The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 1979

Filed:

Apr. 20, 1978
Applicant:
Inventor:

Noriaki Osawa, Tachikawa, JP;

Assignee:

Nihon Beru-Haueru Kabushiki Kaisha, Higashimurayama, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G03B / ;
U.S. Cl.
CPC ...
354 25 ;
Abstract

Disclosed is an improvement in an automatic focusing system for use with an optical instrument having a focusable objective which is adjustable in response to optical and electronic components of the system for determining object distance of a remote subject by comparing images of scanning and reference optical systems. The scanner of the optical system is driven oscillatably across an angle to detect a subject between infinity and the minimum focus condition of the objective lens. The present invention relates to improvements in an automatic focusing system for use with an optical instrument having a focusable objective. More particularly, the improvement relates to driving the focusing system to a preset fixed focus setting when the system senses difficult conditions for focus detection as those having low contrast or complex subject matter. A warning device is included to be activated thereby cautioning the operator that the automatic focus system has reached its operational limit. However, the repeated occurrences of irregular or error signals must be present before the warning device will operate.


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