The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 1979

Filed:

Apr. 06, 1977
Applicant:
Inventor:

Jean R Perilhou, Bourg-la-Reine, FR;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ; G01N / ; G01T / ;
U.S. Cl.
CPC ...
250367 ; 2504 / ; 250505 ;
Abstract

A method and apparatus for computed tomography. A radiation source and a plurality of scintillation detectors rotate about an analysis plane to measure radiation absorption therein. A like plurality of scintillator elements measure radiation from the source along lines in a reference plane which lines coincide with projections of lines connecting the detectors to the source. Fibre optics adjustably couple light from the scintillator elements to photodetectors associated with the scintillation detectors. A rotating shield alternately shields radiation from the scintillation elements and the scintillation detectors. Compensating signals for system deviations are thus produced.


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Perilhou, Jean. (1979). Method of and device for computed tomography (U.S. Patent No. 4145610). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4145610

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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