The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 1979
Filed:
Aug. 29, 1977
Kengi Nakamura, Kyoto, JP;
Hiroshi Yamamoto, Kyoto, JP;
Shimadzu Seisakusho Ltd., Kyoto, JP;
Abstract
Densitometer for quantitative determination of a sample spot on a thin-layer chromatography (TLC) plate or the like having besides the spot an area of impurities developed thereon, wherein the surface of the plate is scanned in a zigzag way by a light beam having a minute cross section. In one stroke of the zigzag scanning of the area containing impurities immediately before the spot the measured signal is integrated and stored by a first integrator and in each and every one of the succeeding strokes of the scanning of the spot the measured signal is integrated by a second integrator. The stored integrated value of the first integrator is subtracted from the integrated value of the second integrator in each and every one of the scanning strokes across the spot and the result of the subtraction is integrated for quantitative determination of the spot without errors caused by the impurities contained in the sample.