The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 06, 1979

Filed:

Nov. 30, 1977
Applicant:
Inventors:

Shingo Nishina, Kawasaki, JP;

Tokuzo Nakaoki, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
3317 / ;
Abstract

A test indicator comprising a holder to which is pivoted a measuring arm with a measuring tip; a casing equipped with a means for magnifying the displacement of said measuring tip; and an intermediate shaft which moves axially in response to pivoted displacement of the measuring tip, thereby transmitting pivotal displacement of the tip to the magnifying means, the holder being fitted to the casing for 360.degree. rotation around the intermediate shaft so that the plane of pivotal movement of the measuring tip can be changed.


Find Patent Forward Citations

Nishina, Shingo. (1979). Test indicator (U.S. Patent No. 4142295). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4142295

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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