The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 1979
Filed:
Apr. 27, 1977
Knut Fischer, Ahnsen, DE;
Gerhard Geisel, Bueckeburg, DE;
Hermann Heye, Obernkirchen, DE;
Abstract
The apparatus includes a photoelectric sensor associated with a predetermined zone of a hollow glass article to be examined for faults. During one testing operation, the photoelectric sensor successively detects all faults in that zone and generates for each a fault signal whose value is dependent upon the characteristics of the fault. The fault signals are applied to a threshold circuit which generates an output signal only when the fault-signal value exceeds a threshold-signal level. The setting-up procedure involves performing at least one preliminary testing operation upon a preselected sample or standard article having acceptable faults. Each threshold-circuit output signal automatically results in a circuit adjustment which reduces by a predetermined amount the extent to which the respective fault-signal value exceeds the threshold-signal level. The preliminary testing operation is performed repeatedly, until the largest-value fault signal generated during one testing operation has a value slightly below the threshold-signal level, whereupon the testing apparatus has been properly set-up automatically. Thereafter, testing operations are performed upon articles whose eventual faults or flaws are not yet known to be acceptable.