The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 1979

Filed:

Aug. 19, 1977
Applicant:
Inventors:

Charles R Kurkjian, Bernards Township, Somerset County, NJ (US);

George E Peterson, Warren, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06G / ;
U.S. Cl.
CPC ...
364802 ; 324 / ; 364554 ; 364578 ; 364806 ;
Abstract

The disclosed device is an analog computer for analyzing data from measurements of physical phenomena or manufacturing processes involving random quantities. The computer includes noise generators whose amplitudes and spectra can be controlled to represent the random variables of the physical system or process under investigation. The random signals, and any periodic signals which may be involved, are fed into the circuit analog of the physical system. The output of the circuit analog is fed into a probability density circuit. The output represents the response of the physical system to the input variables. When the input amplitudes are adjusted to match the output to the measured data, the input levels indicate the relative importance of the input variables to the behavior of the physical system. The computer has been used to analyze the spin resonance line shapes of impurities in glasses. It could be used in a manufacturing setting, for example, to analyze product failure data to determine failure mechanisms dependent upon random variations of processing conditions.


Find Patent Forward Citations

Loading…