The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 1979

Filed:

Jan. 21, 1977
Applicant:
Inventors:

F Paul Carlson, Seattle, WA (US);

Charles K Lee, Seattle, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; G01N / ;
U.S. Cl.
CPC ...
356 39 ; 3401 / ; 356 71 ; 356336 ;
Abstract

Recognizing and counting geometrically distant objects, such as objects of a particular morphological type (e.g., reticulated red blood cells), located in a field of objects of varying types is disclosed. Coherent light is directed toward a monolayer of objects of various types. The light scattered by the objects is collected by a collecting lens and forms a composite Fourier spectrum at the focal plane of the lens. The Fourier spectrum is selectively analyzed on the basis that each object creates a unique portion of the composite Fourier spectrum, and that a family of objects that are geometrically similar have additive spectrums, when their population is large, randomly located, and nonoverlapping. The analysis is performed by making intensity measurements at radial points in the Fourier plane, weighting the measurements, and summing the result. The radial points and weighting factors are determined using regression techniques.


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