The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 1979
Filed:
Oct. 31, 1977
Arlan W Mantz, Acton, MA (US);
Block Engineering, Inc., Cambridge, MA (US);
Abstract
A system for analyzing a time-varying phenomenon in which the latter is repetitively initiated to provide a train of repetitive output signals. A fast Fourier transform interferometer is provied to scan the train. Data corresponding to a selected temporal resolution element having the same selected time position following initiation of each signal are sampled and the samples coded to improve signal-to-noise ratio. The time relation between a selected retardation point in the interferometer and the initiation of each signal in a given train is successively shifted so as to produce a series of coded data, each datum corresponding to a resolution element occurring at the selected time position but at a different interferometer retardation. The selected data are then assembled in their time sequence to generate a synthetic interferogram. The synthetic interferogram, when inversely transformed, provides the spectrum of the phenomenon as it occurred during the temporal resolution element at the selected time position.