The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 1979

Filed:

Jun. 09, 1977
Applicant:
Inventors:

Donald H Daebler, Albuquerque, NM (US);

John H Morgan, Albuquerque, NM (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B07B / ; B07C / ;
U.S. Cl.
CPC ...
209633 ; 209920 ; 209678 ; 209679 ; 209702 ;
Abstract

A substrate grader accepts or rejects a substrate depending upon the degree of warp and then sorts the accepted substrates according to a dimension thereof. The grader comprises a first plate which is U-shaped and inclined at an acute angle with respect to the horizontal, the two arms of the first plate extending above the base thereof. A first elongated member (or lower guide) that is attached to the front of the base has a straight side which is adjacent to and spaced a short distance away from the opening in the first plate. A second elongated member, that is attached to the back of the free ends of the arms, supports a second plate (or upper guide) thereon which extends between the arms, which has a top surface in a plane containing the top surfaces of the arms and base, and which has a stepped edge in the opening. Successive stepped surfaces of this edge are parallel to and spaced progressively farther from the straight surface of the first member such that rectangular substrates contacting these spaced apart surfaces may fall through an opening therebetween to be sorted according to ranges of the length thereof. A pair of flat plates that are supported a prescribed distance above one arm receive substrates therebetween for measuring warp in the substrates. The first plate is mounted on a vibrator which causes substrates to move across this plate.


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