The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 1979
Filed:
Dec. 27, 1976
William D Jansen, Palo Alto, CA (US);
Jerry D Haney, Sunnyvale, CA (US);
Christopher C Day, Newtonville, MA (US);
Stephen A Schneeberger, West Hartford, CT (US);
American Optical Corporation, Southbridge, MA (US);
Abstract
Improved method and apparatus for identifying and quantizing a substantially periodic, steeply rising wavefront of a signal in the possible presence of low amplitude interference. A time derivative of at least the steep wavefront is obtained. The derivative is then integrated over a predetermined interval in each of successive repetitions of the steep wavefront, the interval being that during which the derivative exceeds a reference level. A threshold value is established, preferably dynamically, to verify or validate that when the derivative exceeds the reference level it indeed represents the steeply rising wavefront. The integrated derivative is recognized as the quantized value of the steeply rising wavefront only if such verification occurs. The invention is suited to oscillometric determination of systolic pressure in a patient, where measurement of signal amplitude is preferably achieved by integrating the time derivative of the systolic rise wavefront.