The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 1979
Filed:
Apr. 25, 1977
The Governing Council of the University of Toronto, Toronto, CA;
Abstract
Apparatus for analyzing trace components contained in a sample gas. The sample gas is directed into a reaction chamber and ionized. The resultant trace ions are drifted by an electric field, out of the sample gas, through an inert gas curtain and then through an orifice into a vacuum chamber where they are focused and analyzed. The curtain gas flow may be greater than the flow through the orifice, in which case the gas curtain acts as an ion window which is transparent to ions but blocks sample gas flow into the vacuum chamber. Alternatively, the curtain gas flow may be controlled to admit a desired flow of sample gas through the curtain into the vacuum chamber, in which case the gas curtain acts as a window for ions and as an infinitely variable orifice for the sample gas. Preferably the curtain gas is cryopumpable and is cryopumped by cooling the interior surface of the vaccum chamber.