The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 1979
Filed:
Jan. 28, 1977
Mitsuo Shimada, Ibaraki, JP;
Yoshio Fujii, Ibaraki, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A detecting device is disposed between a separation column to which an eluent is supplied and a flow passage resisting member is located in a flow passage leading to a liquid discharge exit. This detecting device includes a sample cell and a reference cell. The effluent from the separation column is introduced into the flow passage resisting member through the sample cell. A change-over valve is disposed in the flow passage between the separation column and the sample cell and also is connected to one end of the reference cell. The other end of the reference cell is connected to the flow passage between the sample cell and the flow passage resisting member, whereby the reference cell and sample cell are kept communicated with each other. After an eluent has been filled in the reference cell, the communication of the flow passage between the separation column and the sample cell with the reference cell is intercepted by the change-over valve. While this interception is maintained, an effluent from the separation column is passed through the sample cell, and concentrations of respective components in the sample solution are measured by comparing the sample solution with the reference solution in the reference cell with respect to the refractive index or absorbance. Since the noise and drift can be reduced according to this system, the measurement accuracy can be highly improved.