The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 1979
Filed:
May. 17, 1976
De La Rue Instruments Limited, London, GB;
Abstract
Apparatus for gauging the thickness of moving laminar material comprising a gauging nip defined by a first roller of rigid material disposed on a fixed axis and a second roller biassed towards the first roller, the periphery of the second roller being rigid and adapted for movement away from the first roller, means for conveying the material through the nip and proximity detector means radially spaced from the periphery of the second roller and so positioned that the space formed therebetween is reduced upon the passage of material through the nip, the detector means being adapted to generate a material-thickness-indicative signal proportional to the displacement of the periphery of the second roller.