The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 1979
Filed:
Sep. 29, 1977
Viktor V Molochnikov, Minsk, SU;
Vasily I Efimov, Minsk, SU;
Anatoly S Veraxo, Minsk, SU;
Evgeny M Savitsky, Minsk, SU;
Other;
Abstract
An apparatus for measuring the Q-quality of oscillatory circuit components includes a control unit electrically coupled to a high-frequency generator connected to a frequency modulator having its output connected to a measuring unit. The measuring unit is electrically coupled to the oscillatory circuit components whose Q-quality is to be measured. The apparatus includes a unit for producing the first frequency derivative of the amplitude-frequency response of the oscillatory circuit, said unit being connected to a third control unit, and a unit for producing the second frequency derivative of the amplitude-frequency response of the oscillatory circuit, said unit being also connected to said third control unit. The third control unit is connected to a peak detector, to an electronic switch, to a first and second memory units, and to the drive input of the frequency modulator. The proposed apparatus offers high accuracy of measuring the Q-quality and is completely free of errors due to the frequency dependence of the transfer ratios of the measuring unit coupling elements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile