The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 1979
Filed:
Jun. 16, 1977
Applicant:
Inventors:
Tadashi Morokuma, Tokyo, JP;
Kenichi Oinoue, Tokyo, JP;
Assignee:
Olympus Optical Co. Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05B / ;
U.S. Cl.
CPC ...
354298 ; 354299 ; 219216 ; 96 4 / ;
Abstract
A method of monitoring a hot developing treatment which can check a hot developed condition of a film used for a hot developing process is disclosed. At least one portion of those image regions of the film which are simultaneously hot developed by a hot developing heating body is used to photoelectrically monitor the developed concentration of said portion and stop the hot developing treatment when the developed concentration of said portion reaches to a predetermined concentration. An apparatus for carrying out the method is also disclosed.