The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 1979
Filed:
Dec. 16, 1975
Hisataka Takahama, Amagasaki, JP;
Hitoshi Kimura, Kashiwara, JP;
Kubota, Ltd., Osaka, JP;
Abstract
An apparatus for cumulatively measuring the weight of a continuous bulk material conveyed by a belt conveyer, comprising; a pulse generator operatively coupled to the conveyer for generating pulses of the frequency associated with the conveyer speed; a decimal counter for counting the speed associated pulses; a full scale detector coupled to the decimal counter; a load cell operatively coupled to the conveyer for providing an analog signal representative of the weight of the material within a predetermined span of the conveyor; an analog-to-digital converter responsive to the full scale output for converting the analog signal into a bit parallel coded digital signal; logical processing means for modifying the number of pulses obtainable from the decimal counter within one full scale of the counter as a function of the bit parallel coded digital signal and a cumulative counter for counting the pulses thus modified of the pulse number. Preferably, the decimal counter, the logical processing means and the analog-to-digital converter each comprises the most significant digit portion and the less significant digit portions, and the outputs from the most and less significant digit portions of the decimal counter are separately withdrawn for processing to be applied to the cumulative counter, whereby high precision of measurement is attained with a simplified structure.