The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 1979
Filed:
Jan. 19, 1976
Earl J Holdren, Windsor, CA;
Peter Polasek, Grosse Pointe, MI (US);
Thaddeus W Krzys, Jr, Troy, MI (US);
Chrysler Corporation, Highland Park, MI (US);
Abstract
A digital readout test probe comprises: a dual in-line pin, clip-on-type connector for connection to a dual in-line pin integrated circuit; a housing containing a single digit decimal readout display; and a converter circuit whose output drives the readout and whose input is coupled with the clip-on connector by means of color coded lead wires. The display and converter circuit are energized from a separate power supply. When the connector is operatively connected with an integrated circuit, signals from selected terminal pins of the integrated circuit are supplied through the lead wires to the converter circuit. The selected terminal pins provide a binary coded decimal signal and the display shows the decimal value of the binary coded decimal signal so that the user of the probe does not have to decode the binary coded decimal signal into decimal form. The clip-type connector comprises a plurality of conductors each of which conducts a signal from a corresponding terminal pin of the integrated circuit. Each lead wire is uniquely color coded according to the significance of the particular binary digit (bit) input of the converter circuit to which one end of it is fixedly connected. The other end of each lead wire terminates in a hollow pin terminal which may be manually engaged with, and disengaged from, any of the conductors of the clip-type connector whereby the test probe may be conveniently programmed for use with any of the large number of available dual in-line pin integrated circuits.