The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 1979
Filed:
Sep. 16, 1977
Masane Suzuki, Omiya, JP;
Kiyoshi Suzuki, Aego, JP;
Fuji Photo Optical Co., Ltd., Omiya, JP;
Abstract
A moire contour map of a three-dimensional object is obtained by a moire contour measuring system. The moire contour map is used for making a profiling model to be used in a profiling machine to make a number of plates having configurations corresponding to the contour lines of the moire contour map. The number of plates prepared by the profiling machine are stacked to form a stack of plates having a contour approximately equivalent to the contour of the original three-dimensional object. The stacked plates are bound together and a surface smoothing cover or a filling agent is applied on the surface of the stacked plates to form a replica of the object.