The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 12, 1978
Filed:
Oct. 28, 1977
William I White, Elkhart, IN (US);
Miles Laboratories, Inc., Elkhart, IN (US);
Abstract
Multisystem test means, method of making same and method for determining a constituent in a sample under a plurality of reaction parameters. More particularly, a multisystem test means for the determination of a constituent in a liquid sample comprising a plurality of components associated with at least two reaction systems, said reaction system being respectively functional under different reaction parameters, at least one of said components being responsive to the presence of said constituent, and at least one other of said components being effective in response to contact with the sample under reaction parameters at which a first of said reaction systems is functional to change said reaction parameters to those under which at least one other of said reaction systems is functional. The test means, or device incorporated therewith, is contacted with a sample to be tested and after a predetermined time at least one component causes a change in reaction parameters.