The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 1978

Filed:

Sep. 20, 1976
Applicant:
Inventors:

Hans Determann, Nauborn, DE;

Gunter Reinheimer, Biebertal, DE;

Hans W Stankewitz, Steindorf, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
350 91 ; 350 12 ; 350 89 ;
Abstract

Direct illumination apparatus for microscopes for generating illumination of light fields, phase contrasts, interference contrast and dark fields. A deflecting mirror is located in the observation beam, which is partly specular at its center region and fully specular in an annular zone, and an annular condensor is associated with the illumination system. The apparatus is provided with an adjustable stop or diaphragm for the purpose of suppressing the light field beam and with optical components for illuminating an objective pupil for the light field and the annular condensor with collimated light for the dark field. An aperture stop is located in the path of the light field beam nearly or approximately limiting the illumination of the object field in the path of the dark field beam. An annular lens (17) is mounted centrally to the optical axis (15) in the at least approximately collimated dark field beam, this annular lens imaging the diaphragm or aperture stop plane (7) in a plane (18) located near the threaded portion (3') of microscope objective (3).


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