The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 21, 1978

Filed:

May. 10, 1977
Applicant:
Inventor:

Melvin W Siegel, Pittsburgh, PA (US);

Assignee:

Extranuclear Laboratories, Inc., Pittsburgh, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01D / ; H01J / ;
U.S. Cl.
CPC ...
250281 ; 250282 ; 250305 ; 2503 / ;
Abstract

Electric fields for electrostatic optics for focusing or otherwise controlling beams of ions, electrons and charged particles in general produced by surface current distributions which flow on appropriately shaped and located resistive elements from electrical power sources of appropriate voltage connected to two or more points or regions of the resistive surfaces; the resulting electric fields in the proximity of the current carrying surfaces are parallel to these surfaces. Useful electric field configurations may be produced which are inconvenient or impossible to produce by the prior art using surface charge distributions. New and improved analyzers of 'concentric hemisphere' and 'parallel plate' types are specifically utilized for ion kinetic energy selection prior to measurement of the mass-to-charge ratio of secondary ions produced by primary ion bombardment of surfaces.


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