The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 1978
Filed:
Apr. 07, 1977
Kazuo Nagamatsu, Takarazuka, JP;
Tadao Yasuhara, Takatsuki, JP;
Masakazu Oi, Osaka, JP;
Hideaki Maeda, Takarazuka, JP;
Takeda Chemical Industries, Ltd., Osaka, JP;
Abstract
The present invention is a defect inspection method and apparatus for electrically inspecting for the presence of defects in sealed containers of insulating material containing electrically conductive electrolyte or nonelectrolyte fluids, in which the container to be inspected is charged by a high DC voltage to detect the charging current developed and the current neutralizing the charging current for detecting the presence of faults in the container through the magnitudes and the shapes of these currents which are compared with reference values.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile