The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 1978
Filed:
Nov. 26, 1977
Jason M Gordon, Katonah, NY (US);
Peter E Raber, Milford, CT (US);
United Technologies Corporation, Hartford, CT (US);
Abstract
An optical system having a single spherical mirror for collecting light from two directions combined by a beam splitter after the light has been scattered from the surface of a turbine blade or the like. The spherical mirror is located at an equal optical distance from both the surface of the test specimen and a linear detector array so that it operates at a one-to-one magnification ratio. The linear detector array receives light focused by the mirror along a path folded by the beam splitter. This arrangement is helpful in contouring the surface of a turbine blade near a vertical obstruction such as a shroud of a turbine blade since the collection axes of the pickup legs view the incident spot from different directions. None of the optical elements of the inspection system are located in the plane of movement of the test specimen so that even particularly long items such as a helicopter rotor blade can be contoured. Identical upper and lower optical systems allow both surfaces of the test specimen to be contoured simultaneously. An automatic gain control is provided to adjust the optical modulator so that the effective intensity of the beam incident on the detector array is maintained within predetermined limits.