The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 31, 1978

Filed:

Sep. 16, 1976
Applicant:
Inventors:

Masahiko Kato, Kodaira, JP;

Hisao Katogi, Kodaira, JP;

Ikuo Seki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356175 ; 356178 ; 356186 ; 356203 ;
Abstract

A density measuring device for easily and quickly measuring the optical densities of original pictures which is characterized in that an original picture is scanned by a scanning device to obtain electrical signals of the original picture, the signals are then converted into secondary electrical signals corresponding to the optical density of the original picture by means of a logarithmic converting circuit, calibration signals generated by a calibration signal generator are added to the secondary electrical signals, and thus obtained combined signals are displayed on a wave-form monitor.


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