The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 1978

Filed:

Apr. 27, 1977
Applicant:
Inventors:

David B Funk, Virden, IL (US);

William E Midden, Springfield, IL (US);

Assignee:

Dickey-john Corporation, Auburn, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 / ;
Abstract

An analysis instrument for measuring selected constituents present in a sample of a material such as a bulk commodity includes a test cell to receive the sample. The test cell comprises a capacitor whose electrical properties are modified in accordance with the dielectric constant of the sample, which dielectric constant is a function of the contents of the sample. A hopper is mounted above the test cell for holding a quantity of the commodity to be tested and doors forming a bottom of the hopper are selectively openable to introduce the material from the hopper into the test cell. A strike off mechanism is provided for striking off the sample level with the top of the test cell to assure a constant volume of sample material therein. Weight and temperature sensors are provided for measuring the weight and temperature of the sample. An unloading mechanism is provided for rotating the test cell to remove the sample therefrom upon completion of the measurements.


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