The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 1978
Filed:
Mar. 23, 1977
Friedrich M Forster, Reutlingen, DE;
Alfons Kalisch, Reutlingen, DE;
Institut Dr. Friedrich Forster, Prufgeratebau, Reutlingen, DE;
Abstract
The described tube testing apparatus indicates whether a defect is either external or internal, enabling a quantitative classification of defects and an analog representation on location of the defect in the tube wall. The ratio of the signal levels of a defect is taken as a threshold in two different circuit channels. For tubes of a given wall thickness, the ratio of the defect signal levels resulting in the two channels is a fixed number which is a function of the location of a defect in the tube wall causing a defect signal. Uninfluenced test signal voltages from the first channel are available for further evaluation and are applied to voltage discriminators having various threshold voltages. Since the signal levels for external and internal defects are different, this may be effected separately for external and internal defects, offering the possibility for defect classification adapted to the respective requirements, for example, into large, medium or small external defects, or large, medium or small internal defects.