The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 1978
Filed:
Sep. 28, 1977
Sakae Tanahashi, Hiratsuka, JP;
Takashi Shima, Hiratsuka, JP;
Abstract
A press load meter according to the present invention employs strain gauges as stress detectors. Outputs of the stress detectors are analogously processed until they are amplified and the amplified signals are digitally processed in a multiplexed form with respect to each channel whereby measurement in many stress detectors can be accomplished substantially simultaneously. According to the invention, outputs of the respective stress detectors and a total sum thereof appearing before start of an operation cycle of the press are stored in a first memory as initial unbalance components with respect to each channel and a maximum load value during one operation cycle of the press is stored in a second memory with respect to each channel. Contents of the first memory are subtracted from contents of the second memory, the result of the subtraction being displayed with respect to each channel. By these arrangements, a true maximum value of a dynamic stress during a sliding operation of the press can be displayed without requiring a troublesome zero adjustment of the initial unbalance components which has been practiced in a conventional meter. According to another embodiment of the invention, an overload signal is produced when a load applied to the stress detectors has exceeded a predetermined value.