The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 1978

Filed:

Apr. 13, 1977
Applicant:
Inventors:

Kai Lange, Vedbaek, DK;

Verner Toefting, Nivaa, DK;

Ernest J Wiesen, Wauwatosa, WI (US);

Robert R Lijewski, Milwaukee, WI (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T / ;
U.S. Cl.
CPC ...
2503 / ; 250369 ; 364521 ;
Abstract

In a gamma camera system a computer calculates the x and y coordinates of scintillations and a pulse height analyzer determines if they are within the proper amplitude limits for being displayed on a cathode ray tube at corresponding coordinates. Means are provided for correcting nonuniformity or lack of correspondence between the positions of the scintillations and their calculated coordinates. In an accumulation mode, a first memory matrix stores pulse counts for incremental areas of the radiation field when a uniform source is presented to the detectors. When a predetermined maximum number of counts is reached in at least one memory location accumulation is interrupted at which time other locations have fewer counts in them. In the run mode counts are stored in corresponding locations in a second memory matrix and these counts are compared continuously with those in locations in the first memory. Means are provided for injecting a number of counts to make up for the difference between the counts for a given area increment and the counts that should have been obtained for a uniform source.


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