The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 1978

Filed:

Feb. 10, 1975
Applicant:
Inventors:

Roger Daniel Werder, Mohlin, CH;

Linus Meier, Effretikon, CH;

Karl Lang, Uerikon, CH;

Assignee:

Mettler Instrumente AG, Greifensee, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
422 65 ; 2323 / ; 422 67 ; 422 68 ;
Abstract

Operating stations of an automatic analysis apparatus are arranged along a path in which a specimen to be analyzed is moved in a container on a carrier. The specimen is transferred from the carrier to a container supporting platform of each station where it is to be processed, thereby permitting another specimen to by-pass the same station. Different sequences of operations may be performed simultaneously on several specimens without interfering with each other.


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