The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 1978

Filed:

Sep. 20, 1976
Applicant:
Inventor:

James M Lepper, Jr, Redlands, CA (US);

Assignee:

Climet Instruments Company, Redlands, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
356103 ; 250574 ;
Abstract

The forward light scattering photometer for analyzing particles dispersed in a fluid includes a cylindrical housing enclosing a pair of axially spaced, spherical-surfaced, bi-convex lenses which provide axial focusing of the lamp image in an intermediate light scattering chamber through which the sample being analyzed is flowed. Such lenses provide axial focusing with no circumferential aberations and only radial aberations. Light traps having radial borders, such as semicircular blank off discs, are located on the upstream or lamp side of each lens to provide an image having sharp radial edges, thereby eliminating the need for high quality lenses adapted to correct for spherical aberations. The lenses are shielded from contamination by particles from the sample by a stream of purge air introduced into the housing at a location near each lens and tangentially with the housing bore so as to create a stable vortexing flow of the purge air in the vicinity of each lens.


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