The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 1978

Filed:

Mar. 02, 1977
Applicant:
Inventors:

Brian S Flanagan, San Diego, CA (US);

Phillip L Turner, Del Mar, CA (US);

Richard D Broce, Vista, CA (US);

Peter L Lagus, Olivenhain, CA (US);

Assignee:

Systems, Science and Software, La Jolla, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T / ;
U.S. Cl.
CPC ...
250381 ;
Abstract

A gas monitor comprising means for detecting changes in electron flow between two electrodes caused by absorption of the electrons by an electron capture gas flowing between the electrodes. A carrier gas is supplied to the detecting means at a predetermined velocity. A sample of the gas to be measured is added to the carrier gas by a valve means at a predetermined time which gas sample contains a trace of a first type of electron capture gas. The carrier gas together with any gas sample flows through a column means which slows down the velocity of any other type of electron capture gas in the sample with respect to the velocity of the first type of electron capture gas. The gas then passes through the detector wherein the electron capture gas causes a decrease in the electron flow between the electrodes. Means are provided for measuring the maximum decrease in the electron flow caused by the first type of electron capture gas and means are coupled to the measuring means for indicating the maximum decrease.


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