The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 1978

Filed:

Dec. 16, 1976
Applicant:
Inventors:

Takeshi Yamawaki, Hiratsuka, JP;

Tokitaro Hoshijima, Yokohama, JP;

Kiichiro Aga, Machida, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
73 81 ; 73 82 ;
Abstract

In apparatus for measuring the hardness of rubber of the type wherein a needle is urged against the surface of a rubber sample and the degree of penetration of the needle is measured there are provided a coil spring, a lever for causing the needle to compress the spring and a releasable latch for holding the spring in the compressed state. When the spring is released it urges the needle against the rubber sample under a prescribed speed and force. The displacement of the needle is detected by an electric transducer and its output signal is processed by an electric circuit including a peak detector and an analogue-digital converter for digitally displaying the displacement. When the spring is released a switch is operated to start the analogue-digital converter for determining the starting point of the time necessary to measure the displacement by using the time as a parameter.


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