The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 1978
Filed:
Dec. 21, 1976
Yoshihiko Honjo, Ayase, JP;
Junji Kuroda, Zama, JP;
Victor Company of Japan, Ltd., Yokohama, JP;
Abstract
The invention relates to a system for detecting the height fluctuations of a surface on a recording medium in an optical recording or reproducing apparatus. A light source emits a main light beam for recording or reproducing. An optical system, including an objective lens, focuses the main light beam into a spot on the surface. A first reflecting mirror introduces a sublight beam into the peripheral part of the main light beam. The sub-light beam advances in a forward path through the objective lens to be projected onto the recording surface and reflected thereby. The sub-beam returns again through the objective lens along the peripheral part of the main light beam, but on the opposite side from said forward path. A second reflecting mirror extracts the sub-light beam in the return path out of the light to operate a detector which detects fluctuations in the distance between the objective lens and the recording surface and to produce control signals maintaining a constant distance between the objective lens and recording surface.