The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 1978
Filed:
Jul. 16, 1976
Shoji Akutsu, Chiba, JP;
Yasumasa Watanabe, Chiba, JP;
Yasuhiko Mashino, Chiba, JP;
Tomohiro Chaki, Tokyo, JP;
Masakazu Fujita, Tokyo, JP;
Kawasaki Steel Corporation, Hyogo, JP;
Toei Denshi Kogyo Kabushiki Kaisha, Tokyo, JP;
Abstract
A method of and an apparatus for inspecting a traveling sheet material, in which the ability to detect a defect is made as close to the identifying ability of man's visual inspection as possible, the detected defect is converted into an electrical signal and separated into four factors of width, quantity, depth or density, and length to make the sorting process most economical, the factors are discriminated to be of high, medium or low class, respectively, and the discriminated defect factors are synthetically judged through a decision circuit according to a defect pattern.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile