The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 1978
Filed:
Mar. 08, 1977
Shigeru Saeda, Oita, JP;
Yukinori Suzaka, Oita, JP;
Showa Denko K.K., Tokyo, JP;
Abstract
Environmental stress cracking of a given material is measured by a method comprising the steps of deforming a test piece of said material for thereby producing stress therein, placing the deformed test piece in a test environment, externally applying thereto stress of a magnitude smaller than that of the stress already produced therein until the test piece fractures and clocking the time the test piece stands in said test environment before fracturing. Said measurement is performed by use of a device which comprises means for holding test pieces, loading means for applying stress to said test piece holding means and indicating the displacement of the test piece occurring at the time of its fracture and means for sensing the displacement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile