The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 1978
Filed:
Feb. 28, 1977
Melvin W Siegel, Pittsburgh, PA (US);
Extranuclear Laboratories, Inc., Pittsburgh, PA (US);
Abstract
A method and apparatus for mass spectrometry employing tandem chemical ionization (CI) and electron impact (EI) ionization chambers with independent ionizing electron sources, both CI and EI ions being produced simultaneously. Through electronic shuttering either the CI or EI ions may be transmitted to the mass spectrometer while the ions of the other type are dispersed and rejected. The shuttering being accomplished very rapidly relative to the mass scan rate, which is in turn fast with respect to temporal variations in sample material composition. The two interwoven ion sequences are demultiplexed and smoothed into independent and effective simultaneous CI and EI mass spectrum channels.