The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 1978

Filed:

Oct. 07, 1976
Applicant:
Inventors:

Robert Lee Baker, Conyngham, PA (US);

Calvin Michael Mahoski, Hazleton, PA (US);

John David Partilla, Wilkes-Barre, PA (US);

Harold Robert Ronan, Jr, Mountaintop, PA (US);

Assignee:

RCA Corporation, New York, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ; H01B / ;
U.S. Cl.
CPC ...
3241 / ; 29416 ; 29624 ; 3241 / ; 3391 / ;
Abstract

A chuck for use in the testing of semiconductor wafers comprising first and second pluralities of electrically conductive members alternately arranged to provide a wafer receiving surface. The members are substantially completely electrically isolated from each other. Electric power leads and measurement sensing leads are provided to the first plurality of conductive members and the second plurality of conductive members respectively.


Find Patent Forward Citations

Baker, Robert. (1978). Chuck for use in the testing of semiconductor wafers (U.S. Patent No. 4104589). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4104589

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…