The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 1978

Filed:

Sep. 29, 1976
Applicant:
Inventors:

Chuji Tomita, Tokyo, JP;

Hiroshi Abe, Kashiwa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B / ;
U.S. Cl.
CPC ...
2504 / ; 250490 ;
Abstract

A scanning apparatus for cross-sectional inspection equipment in which an X-ray source and a detector, which are arranged facing each other with an object in between, reciprocate along and rotate about a required cross-sectional plane of the object. The X-ray source and detector are mounted on a movable frame which is provided on a rotating disc and reciprocate, after being rotated through a small rotating-angle of the rotating disc by means of one drive source and mechanical mechanism. Thus, accurate operating timing and simplified construction are achieved.


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