The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 1978
Filed:
Dec. 13, 1976
Edward A McClatchie, Berkeley, CA (US);
Dean A Watson, Berkeley, CA (US);
Irvin G Burough, Walnut Creek, CA (US);
Andros, Incorporated, Berkeley, CA (US);
Abstract
An improved gas analyzer for measuring the presence of one or more gaseous compounds in a gas sample. The gas analyzer has an infrared source stablized against temperature variations by a radiation loading scheme in combination with a selected source environmental temperature sensitivity to provide a stable source temperature without a conventional temperature controller. A rotating interference filter assembly is disposed in the optical path. This assembly alternately totally blocks radiation, passes radiation in a wave length band which will not be absorbed by a random gas sample, and sequentially passes radiation in one or more additional bands which will be absorbed by one or more gases in the sample cell. The sample cell features a unique enclosed cell with infrared transparent windows which are substantially free of impingement of contaminants of the gas sample thereon. A unique detector provides protection against deterioration from moisture while allowing easy and inexpensive assembly. The system electronics eliminates sensitivities to background radiation, contamination of windows, etc., and provides a self test capability.