The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 1978

Filed:

May. 11, 1977
Applicant:
Inventors:

Herman H Wieder, San Diego, CA (US);

Neil M Davis, San Diego, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356117 ;
Abstract

A method and means of monitoring the quality of a fluid dielectric capacitor by measuring the Kerr signal of a dielectric fluid which has the desired dielectric and breakdown properties and continually measuring the Kerr signal of the same fluid dielectric while in use to determine if there is any degradation of the fluid in use. The means for measuring the Kerr signal is by projecting a high intensity light beam such as from a laser source through the dielectric fluid of a capacitor between two of the plates and detecting the amount of light passed through the dielectric which is an indication of the condition of the dielectric liquid.


Find Patent Forward Citations

Wieder, Herman. (1978). Method and means of monitoring the quality of a fluid dielectric (U.S. Patent No. 4102574). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4102574

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…