The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 1978
Filed:
Nov. 01, 1976
Applicant:
Inventor:
Hidde Herman Brongersma, Eindhoven, NL;
Assignee:
U.S. Phillips Corporation, New York, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250305 ; 250310 ;
Abstract
A device for analysing a surface layer by means of ion scattering. The device comprises an energy selector having two coaxial cylindrical electrodes. A primary mono-energetic ion beam impinges upon the surface layer and its axis coincides with the axis of the cylindrical electrodes. Back-scattered ions, the paths of which lie on a conical surface having an apical angle of 180.degree. reduced with the scattering angle, are selected for energy and detected.
Brongersma, Hidde. (1978). Device for analyzing a surface layer by means of ion scattering (U.S. Patent No. 4100409). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4100409
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile