The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 1978
Filed:
May. 14, 1975
George E Forsen, Glastonbury, CT (US);
Stephen F Jackson, East Hartford, CT (US);
Scan-Optics, Inc., East Hartford, CT (US);
Abstract
As described herein, a program controlled image dissector tube scans the printed information recorded on a storage medium in a first raster to provide analog information signals representative of segments of the recorded information and in a second raster to provide analog information signals representative of all the recorded information. If, as determined by the analog information signals representative of segments of the recorded information, the printed information is legible, the analog information signals representative of all the printed information are converted into digital form and scaled, if necessary, to reduce the digital character data to a predetermined scan length. Selected arrays of the digital character data are then scanned to develop black or white signals about a center bit within such arrays. The black or white signals are, in turn, accumulated to provide an array of black and white signals representative of an entire character. The contour of the array of black and white signals is then traced to develop contour digital data representative of incremental moves about the perimeter of the character. The extent and direction of such incremental moves are then accumulated to develop parameters. The parameters are then selectively combined and the areas bounded by such parameters calculated to develop feature indication signals. The feature indication signals are then accumulated, compared against preselected recognition thresholds and classified as a particular character.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile