The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 1978
Filed:
May. 24, 1977
Donald P Brezinski, Corning, NY (US);
Corning Glass Works, Corning, NY (US);
Abstract
A test sample for testing a recording fluorometer/densitometer has multiple tracks with features that generate detector outputs indicating performance parameters. In the normal mode of operation the instrument scans the optical absorbance or fluorescence characteristics of electrophoretic samples in a plurality of tracks on a thin agarose film plate. In order to correctly record the optical characteristics of these electrophoretic samples, the instrument must respond linearly and with the correct range, resolution and alignment. A test sample is scanned in the same manner as a normal sample. The resulting instrument output provides easily analyzed information on fluorometric and densitometric performance parameters including linearity, range, spatial resolution, slit and scan path alignments, scan speed and excitation uniformities, response time, noise, electrical and optical offsets, integration accuracies, automatic gain and zeroing accuracies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile