The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 1978

Filed:

May. 25, 1976
Applicant:
Inventors:

Hans Mahlein, Munich, DT;

Walter Rauscher, Munich, DT;

Assignee:

Siemens Aktiengesellschaft, Berlin & Munich, DT;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ;
U.S. Cl.
CPC ...
350295 ; 350164 ;
Abstract

An optical layer device having a substrate with a surface having one or more layers of either dielectric or metallic materials provided thereon characterized by the substrate being mounted on a holder and being of an elastically deformable material and means for deforming the substrate so that the substrate may be deformed in a predetermined spherical or aspherical fashion. Depending on the construction of the layers, the device may be utilized as either a variable reflector or a variable interference filter. In one embodiment of the invention, the deforming of the substrate is accomplished by varying a pneumatic pressure in the chamber which pressure contacts one surface of the substrate. In another embodiment of the invention, the deforming is accomplished by selectively heating the holder and substrate so that a predetermined deformation is caused by the different rate of thermal expansion for the holder and substrate.


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