The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 1978
Filed:
Jun. 17, 1974
Applicant:
Inventor:
Gary F Sallee, Yorba Linda, CA (US);
Assignee:
Rockwell International Corporation, El Segundo, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01B / ; G01N / ;
U.S. Cl.
CPC ...
73 8 / ; 73597 ; 73DI / ; 310313 ;
Abstract
A strain detector comprises an oscillator having a surface acoustic wave delay line as its frequency control element. The delay line is constructed on a substrate, such as quartz which is disposed to distort in response to the strain to be measured. Distortion of the substrate alters the frequency control characteristics of the surface acoustic wave delay line with a consequent change in oscillator frequency. The change in frequency is proportional to the distortion of the substrate. A strain gage employs the detector output frequency as the input signal to a frequency measuring system.