The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 1978
Filed:
Jan. 31, 1977
Applicant:
Inventor:
Terumitsu Sugita, Narashino, JA;
Assignee:
Seiko Seiki Kabushiki Kaisha, , JA;
Primary Examiner:
Int. Cl.
CPC ...
B24B / ;
U.S. Cl.
CPC ...
51290 ; 5116588 ; 5116593 ;
Abstract
An inprocess size measuring device has at least two feelers which respectively detect inner surface positions of an annular workpiece rotatably supported at the outer periphery thereof by a pair of shoes. The outputs from the feelers of the size measuring device are received to be converted by an operation means both into the inner diameter and into the center error of the workpiece. For this error the infeed of the infeed table is compensated.
Sugita, Terumitsu. (1978). Method to compensate infeed for the error caused by the outer diameter (U.S. Patent No. 4095377). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4095377
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile