The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 1978

Filed:

Feb. 02, 1977
Applicant:
Inventors:

Donald H Ball, Bartlesville, OK (US);

Robert W Rutledge, Bartlesville, OK (US);

James D Voelkers, Bartlesville, OK (US);

Assignee:

Phillips Petroleum Company, Bartlesville, OK (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C01C / ; G06F / ; G06F / ; G06G / ;
U.S. Cl.
CPC ...
423359 ; 2323 / ; 2323 / ; 2325 / ; 2325 / ; 364105 ; 364111 ; 423362 ; 364500 ;
Abstract

In the measurement of a variable process parameter and control of the process in response thereto, a transform of a process parameter measurement signal that can be described as the time derivative of a second order or higher lagged process parameter measurement signal is utilized to provide predictive capability. This transform is combined with the output of a PI controller to the input of which the process parameter measurement signal has been fed, thereby generating a process variable signal that either directly or after passing through another controller is utilized as a process control signal for controlling the process in response to the measured parameter. The system is particularly well adapted to control of a non-self-regulating process.


Find Patent Forward Citations

Ball, Donald. (1978). Process measurement and control (U.S. Patent No. 4094959). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4094959

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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