The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 1978

Filed:

Dec. 22, 1976
Applicant:
Inventor:

Hitomi Aizawa, Suwa, JA;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G04C / ;
U.S. Cl.
CPC ...
58 2 / ; 58 855 ;
Abstract

An inspection circuit for facilitating the inspection of the components of an electronic timepiece at the time that same is manufactured is provided. The inspection circuit is provided in an electronic timepiece having oscillator circuitry for producing high frequency time standard signals and divider circuitry for dividing down the high frequency time standard signal and producing a lower frequency time standard signal. The electronic timepiece further includes timekeeping counter circuitry for producing timekeeping signals and a digital display for displaying time in response to the timekeeping signals being applied thereto. The inspection circuit of the instant invention is particularly characterized by an auto-clear circuit coupled to the timekeeping counter and divider circuitry for detecting a power-on condition and in response thereto, applying a reset signal to the divider and timekeeping counter circuitry to thereby reset the counts thereof. The inspection circuit is coupled intermediate the divider timekeeping counter and divider circuitry and is adapted to receive the reset signal and apply to the digital display a first inspection signal to permit a first inspection of the digital display to be effected until the flower frequency time standard signal is applied to the inspection circuit.


Find Patent Forward Citations

Loading…