The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 23, 1978
Filed:
Jan. 26, 1977
Seiji Kashioka, Hachioji, JA;
Masakazu Ejiri, Tokorozawa, JA;
Michihiro Mese, Hachioji, JA;
Takafumi Miyatake, Hachioji, JA;
Toshimitsu Hamada, Tokyo, JA;
Isamu Yamazaki, Tachikawa, JA;
Hitachi, Ltd., , JA;
Abstract
A pattern position detecting system comprising first means to sequentially fetch local images in a two-dimensionally arrayed form from a video signal in accordance with the scanning of an image and at sampling intervals which are variably instructed independently in the vertical and horizontal directions, second means to hold two-dimensional patterns having the same array as the local images, third means to evaluate the degree of non-coincidence between the image of the first means and the pattern of the second means, fourth means to store the position of an image scanning point at the time when the degree of non-coincidence becomes the minimum in a predetermined range within a picture frame, fifth means to calculate the position of an object from the position obtained by the fourth means, and sixth means to store the vertical and horizontal sampling intervals necessary for the operation of the first means, the two-dimensional patterns for use in the second means and numerical values necessary for the positional calculation of the fifth means, and to select required ones and send them to the first, second and fifth means.